Field Emission Scanning Electron Microscope; Quanta FEG 250, FEI

The field emission scanning electron microscope uses secondary and backscattered electrons to produce high-resolution images of objects for surface analysis.

• General description: field emission scanning electron microscope (FESEM)
• Application aim: examination of very small objects in different magnifications
• Mobility: not mobile
• Equipment specifics:
  • Magnification up to 2*106x
  • Crystal serves as the cathode
  • 3D view of objects
  • SDD X-ray detector
• Application requirements: none
• Sample required: yes, only small samples
• Contact required: no
• Interaction spot dimensions: different, depending on the magnification
• Limitations: damage to the objects by the electron beam; the objects to be examined must be dry; no determination of elements possible
• Set up time: approx. 2 hours after sample change until good vacuum has built up
• Average time for measuring: immediately
• Average time for processing: no processing required
• Software package: xT microscope Server
• Output: .tif for images
• Contact:Jörg Fromm, joerg.fromm"AT"uni-hamburg.de
• Location of the equipment: Institute of Wood Science (Leuschnerstr. 91 d, Hamburg)