Atomic Force Microscopy

Laura Gallardo Dominguez

This technique is suitable to resolve small areas of a sample surface (micrometer range). It offers images based on the topography of the sample, but it can also be used to map space dependent properties such as mechanical stiffness or electrical conductivity. The surface of the artefact is scanned using a nanometre sized tip that sweeps the surface of the material. The deflection of this cantilever is monitored using a laser and an image can be reconstructed from this information.